Surface Analysis Systems

What is surface analysis ?

The determination of the composition of the outer most atomic layers of a material plays a truly crucial role in the properties of the composite itself. Such properties that are affected by such composition are adhesion, chemical activity, wettability, electrostatic behavior, corrosion resistance and bio-compatibility. Enabling the characterization of thin film structures, via sputter profiling provides a unique way to examine materials used in both research and application based purposes.

These features make surface analysis quite important in relation to the analysis of sub-micron features such as defects and contaminants. Information gathered from this can aid in the increase in production yield of certain applications including but not restricting, semiconductor fabrication, hard disc read/write head fabrication, mirror and composite material manufacturing.


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Chemistry : Image Examples

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Product Range

Ellipsometry - Click HERE for Product Page

CLICK HERE - Spectroscopic Ellipsometry

CLICK HERE - Laser Ellipsometry

Electron Microscopy - Click HERE for Product Page

CLICK HERE - SNE - 4500 M - High Resolution Table-top SEM (x100K)

CLICK HERE - SNE - 3200 M - Highly Efficient Table-top SEM (x60K)

TEM and SEM Sample Preparation - Click HERE for Product Page

CLICK HERE - DESK V / TSC - Sample Coater

CLICK HERE - Bench Top Turbo


Surface Analysis Systems - Click HERE for Product Page



CLICK HERE - ScientaOmicron : MULTISCAN Lab

X-ray Fluorescence Analysis - Click HERE for Product Page

CLICK HERE - Micro X-ray Fluorescence Analyser

CLICK HERE - XFR for SEM - ƒX Custom X-ray Source

CLICK HERE - SDD Detectors


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