Spectroscopic Ellipsometry SENresearch: Spectroscopic ellipsometer family The high end SENresearch is designed for spectroscopic ellipsometry in the widest spectral range from 190 nm (deep UV) to 3,500 nm (NIR). Using the Step Scan Analyzer principle, the SENresearch measures thin film … Continue reading →

ICP-RIE Plasma Etcher SI 500 Low damage for nano structuring – Due to the low ion energy distribution, low damage etching and nano structuring can be performed with our icp plasma etching tools. Simple high rate etching – High rate … Continue reading →

Scitek provides a wide range of Thin Film Deposition products used to built or optimize product design across a wide array of applications. Applications range from an increased production rate of silicon chips to increased adhesion strength and reproducibility, making … Continue reading →

Plasma SystemsAt Scitek we provide a range of plasma systems for our customers laboratory needs, we offer products from both Diener electronics and Evatec who are trusted brands within the industry. Our products are capable of producing plasma at low pressures, offering … Continue reading →

Surface Analysis Systems Why is surface analysis important ?  The composition of the outer most atomic layers of a material play a critical role in properties such as: adhesion, chemical activity, wetability, electrostatic behaviour, corrosion resistance and bio-compatibility. The ability … Continue reading →