Surface Analysis

TEM & SEM Imaging Spectroscopy

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TPX3CamThe TPX3Cam is a fast optical camera for time stamping of optical photons. It is based on a new silicon pixel sensor, which in combination with the Timepix3 ASIC and readout, is suitable for a wide range of applications which … Continue reading

RISE Electron Microscopy

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RISE – Correlative Raman Imaging and Scanning Electron Microscopy World’s first fully-integrated Raman Imaging and Scanning Electron Microscopes RISE Microscopy is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging. Through RISE Microscopy ultra-structural surface properties can … Continue reading

Atomic Force Microscopy

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Park NX-HivacHigh vacuum atomic force microscope for failure analysis and atmosphere-sensitive materials research Park NX-Hivac allows failure analysis engineers to improve the sensitivity and repeatability​ of their ​AFM ​measurements through high vacuum ​environment. Because high vacuum ​measurement offers greater accuracy, better … Continue reading

X-ray Fluorescence Analysis

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Micro X-ray Fluorescence AnalyserThe Atlas Micro-XRF spectrometer (µXRF) from IXRF Systems introduces a new world of x-ray mapping and automation. The Atlas™ boasts the largest chamber volume and SDD detection area (150mm2) as well as the smallest spot size (5µ) … Continue reading