A surface is an interface, a marked transition from one material to another. Because no change is ever instantaneous there is a finite depth for any real surface. Surface depth is defined by the technique used to characterize it. Surface depth may vary from an atomic layer (approximately 3-5 Å) to as much as 1 µm.

Commonly use techniques for topography are optical microscopes and SEM.

Elemental / Chemistry techniques include Auger Electron Spectroscopy, X Ray Photoelectron Spectroscopy, Secondary Ion Mass Spectroscopy, X Ray Fluorescence and Fourier Transform Infrared.

Our partners Physical Electronics PHI and RBD Instruments are innovative global leaders in surface analysis instrumentation. They focus on X-Ray Photoelectron Spectroscopy (XPS), Auger Electron Spectroscopy (AES) and Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS). RBD Instruments have first started out as a company specialised in upgrading older PHI systems who, today, is also offering their own developments to further improve surface analysis instrumentation.

With an installation base of over 1000 Auger based and nearly 200 TOF-SIMS PHI is a real market leader.

Scitek has factory trained staff on hand to advise you on the best solution for your surface analysis challenge.