TEM & SEM Imaging Spectroscopy

K3 IS Camera - in-situ Microscopy

K3™ IS – The world’s first counting, high-speed, large format camera for in-situ microscopy. Extending K3’s resolution revolution to material science, you can now count single electrons with unprecedented temporal resolution to produce the highest signal-to-noise in-situ results available. K3 IS not only enables low-dose imaging capabilities but redefines how you can resolve undiscovered details during in-situ environmental reactions and beam sensitive material studies.

  • Highest Image Quality
    • Superior DQE is required for the most-demanding low-dose and in-situ applications
    • See your sample, not beam artifacts with counted, low-dose images
  • Unsurpassed Resolution & Field of View
    • Count 1500 full fps across 14 megapixels (4,096 x 3,456) – 3.7x the frame rate of K2
    • Store 75 fps at full sensor resolution to 1200 fps with sub area, no binning required
  • Shortest Time to Results
    • Ensure you collect the best data possible by quickly previewing results at the microscope
    • Minimize time to results with well-established GMS in-situ analysis utilities, including free offline tools

Insist on the highest performance camera and discover how the K3 IS extends Gatan’s tradition of enabling new science for materials and in-situ imaging – year after year.

GIF Continuum and Continuum S - Advanced Systems for EELS & EFTEM


The Continuum™ series represents the next generation of electron energy loss spectroscopy (EELS) and energy-filtered transmission electron microscopy (EFTEM) systems from Gatan. By focusing on simplifying the operation of energy-loss systems without sacrificing any of the power or flexibility, the Continuum series enables new levels of productivity and data throughput. Built around new and exclusive detector systems, the Continuum delivers outstanding detector speed and quality for both EELS and EFTEM applications.


  • >8000 spectra per second at >95% duty cycle
  • >10x faster system tuning
  • Streamlined, workflow-based user interface


  • Low-noise, high dynamic range CMOS detector
  • Improved MTF and DQE from new XCR™ sensor stack technology
  • Full gain correction in all acquisition modes
  • Exclusive dynamic focus control
  • Choose the K3™ electron counting direct detector for the ultimate EELS and EFTEM data quality


  • Energy-filtered 4D STEM*
  • In-situ EELS and EFTEM*
  • Momentum-resolved EELS*

Monarc CL Detector - SEM-based Cathodoluminescence Refinement


Built upon a groundbreaking optical design, Monarc dramatically boosts sensitivity and spectral resolution, empowering the most complete cathodoluminescence (CL) analysis to date with unique wavelength- and angle-resolved capabilities. This true next generation CL detector now provides brand new insights in the most demanding applications in nanophotonics, optoelectronics, and geosciences.

Fastest time to the best data

  • Acquire CL data with unmatched spatial (<10 nm), angular (1°), and wavelength (0.1 nm) resolutions
  • Simultaneously capture angle- and wavelength-resolved CL data
  • Collect hyperspectral data up to 30 times faster than other CL detectors

Easy operation for all users

  • Guarantee optimal results with fully automated alignment and recipe-driven operation
  • Permanently aligned optics deliver reproducible results across the short- and long-term
  • Utilize the largest field of view to increase the data throughput and simplify user workflows

Most accurate correlation with other signals

  • Detect multiple signals simultaneously for correlated imaging of physical properties and composition with CL data
  • No compromises – Make full use of the in-lens SEM detectors during CL measurements


  • Angle-resolved (ARCL): Understand how light and matter interact far below the optical diffraction limit – Provides a 400x larger field of view than other CL detectors with virtually no loss in resolution (patent pending)
  • Wavelength- and angle-resolved (WARCL): Visualize how light and matter interact across multiple viewing angles and wavelengths at full resolution – What was impossible or highly impractical, is now routine with Monarc’s unique optical design
  • Polarization filtering: Determine the emission polarization properties of deep sub-wavelength structures like optical nanoantenna, nano-cavities, and photonic crystals