Surface Analysis Systems

RISE Imaging

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Rise – Correlative Raman Imaging and Scanning Electron MicroscopyWorld’s First fully-integrated Raman Imaging and Scanning Electron Microscopes. RISE Microscopy is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging. Through RISE Microscopy ultra-structural surface properties can be linked … Continue reading →

Raman Imaging

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Raman spectroscopy provides a chemical “fingerprint” of the investigated compounds is non-invasive, non-destructive requires minimal, if any, sample preparation is insensitive to water can be used for imaging. Continue reading →

Atomic Force Microscopy

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How AFM WorksAtomic force microscopy is arguably the most versatile and powerful microscopy technology for studying samples at nanoscale. It is versatile because an atomic force microscope can not only image in three-dimensional topography, but it also provides various types … Continue reading →